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dc.contributor.authorSzeptycki, Przemyslaw
dc.contributor.authorArdabilian, Mohsen
dc.contributor.authorChen, Liming
dc.contributor.editorBrömme, Arslan
dc.contributor.editorBusch, Christoph
dc.date.accessioned2018-11-19T13:16:37Z
dc.date.available2018-11-19T13:16:37Z
dc.date.issued2012
dc.identifier.isbn978-3-88579-290-1
dc.identifier.issn1617-5468
dc.identifier.urihttp://dl.gi.de/handle/20.500.12116/18302
dc.description.abstractNose tip localization is often the basic step for 2.5D face registration and further 3D face processing and as such appears as a side problem of most research works on 2.5D or 3D face recognition. In this paper, we propose to carry out a comprehensive study of four popular rotation invariant differential geometric properties, namely Mean and Gaussian curvature, Shape Index and Curvedness, for the purpose of nose tip localization. For each 2.5D facial model, the set of nose tip candidates is first automatically selected from a shape classification thanks to a priori knowledge of a nose region. A SVM classifier trained on a subset of the data set using the previous four curvature descriptors alone or in combination is then invoked to select the true nose tip from the candidate set. We report extensive experimental results crossvalidated in terms of True Acceptance Rate (TAR) and False Acceptance Rate (FAR) in comparison with manually labeled nose tip as the ground truth. A 99.9% Nose Tip TAR with 6.71% FAR is achieved on the FRGC v2.0 dataset when Mean curvature and Shape Index along with Curvedness are used as the input to the SVM.en
dc.language.isoen
dc.publisherGesellschaft für Informatik e.V.
dc.relation.ispartofBIOSIG 2012
dc.relation.ispartofseriesLecture Notes in Informatics (LNI) - Proceedings, Volume P-196
dc.titleNose tip localization on 2.5D facial models using differential geometry based point signatures and SVM classifieren
dc.typeText/Conference Paper
dc.pubPlaceBonn
mci.reference.pages257-268
mci.conference.sessiontitleRegular Research Papers
mci.conference.locationDarmstadt
mci.conference.date06.-07. September 2012


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