Optimizing Distributed Test Generation
Zusammenfassung
This paper presents two optimizations of the master-slave paradigm which provides more robustness. The former uses a mobile master which randomly jumps from node to node in order to dispatch the bandwidth load during the application execution. The latter aims to fully decentralize the paradigm like peer-to-peer systems. We present and experiment our new schemes on an application dedicated to test generation used in protocol engineering. We show that they can help for unknown dynamic environments where no information is given about nodes configuration.
- Vollständige Referenz
- BibTeX
Gros-Désormeaux, H., Fouchal, H. & Hunel, P.,
(2010).
Optimizing Distributed Test Generation.
In:
Eichler, G., Kropf, P., Lechner, U., Meesad, P. & Unger, H.
(Hrsg.),
10th International Conferenceon Innovative Internet Community Systems (I2CS) – Jubilee Edition 2010 –.
Bonn:
Gesellschaft für Informatik e.V..
(S. 79-90).
@inproceedings{mci/Gros-Désormeaux2010,
author = {Gros-Désormeaux, Harry AND Fouchal, Hacène AND Hunel, Philippe},
title = {Optimizing Distributed Test Generation},
booktitle = {10th International Conferenceon Innovative Internet Community Systems (I2CS) – Jubilee Edition 2010 –},
year = {2010},
editor = {Eichler, Gerald AND Kropf, Peter AND Lechner, Ulrike AND Meesad, Phayung AND Unger, Herwig} ,
pages = { 79-90 },
publisher = {Gesellschaft für Informatik e.V.},
address = {Bonn}
}
author = {Gros-Désormeaux, Harry AND Fouchal, Hacène AND Hunel, Philippe},
title = {Optimizing Distributed Test Generation},
booktitle = {10th International Conferenceon Innovative Internet Community Systems (I2CS) – Jubilee Edition 2010 –},
year = {2010},
editor = {Eichler, Gerald AND Kropf, Peter AND Lechner, Ulrike AND Meesad, Phayung AND Unger, Herwig} ,
pages = { 79-90 },
publisher = {Gesellschaft für Informatik e.V.},
address = {Bonn}
}
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Mehr Information
ISBN: 978-3-88579-259-8
ISSN: 1617-5468
Datum: 2010
Sprache:
(en)
(en)
Typ: Text/Conference Paper

