I-pattern for gap analysis
Zusammenfassung
Patterns are an effective way to express solutions to constantly occurring problems in software engineering. Books like Erich Gamma's Design Patterns ([Gam94]) or Martin Fowler's Analysis Pattern ([Fow96]) helped to develop a common understanding of problem solving in this field. The pattern catalog developed by members of the chair Software Engineering for Business Information Systems (sebis) of TU-Munich ([BELM08]) addresses patterns related to reoccurring problems in enterprise architecture management (EAM) and the authors are still working on this catalog. [BELM08] mentions several concerns related to SOA but is missing patterns concerning the initiation of SOA. This contribution will elaborate on an I-Pattern related to SOA-initiation on the basis of [EHH+08]. The focus lies on the problem of gap analysis on application landscapes as stated in [PSS09] and will further add metrics for gap analysis to this I-Pattern.
- Vollständige Referenz
- BibTeX
Gringel, P. & Postina, M.,
(2010).
I-pattern for gap analysis.
In:
Engels, G., Luckey, M., Pretschner, A. & Reussner, R.
(Hrsg.),
Software Engineering 2010 – Workshopband (inkl. Doktorandensymposium).
Bonn:
Gesellschaft für Informatik e.V..
(S. 281-292).
@inproceedings{mci/Gringel2010,
author = {Gringel, Philipp AND Postina, Matthias},
title = {I-pattern for gap analysis},
booktitle = {Software Engineering 2010 – Workshopband (inkl. Doktorandensymposium)},
year = {2010},
editor = {Engels, Gregor AND Luckey, Markus AND Pretschner, Alexander AND Reussner, Ralf} ,
pages = { 281-292 },
publisher = {Gesellschaft für Informatik e.V.},
address = {Bonn}
}
author = {Gringel, Philipp AND Postina, Matthias},
title = {I-pattern for gap analysis},
booktitle = {Software Engineering 2010 – Workshopband (inkl. Doktorandensymposium)},
year = {2010},
editor = {Engels, Gregor AND Luckey, Markus AND Pretschner, Alexander AND Reussner, Ralf} ,
pages = { 281-292 },
publisher = {Gesellschaft für Informatik e.V.},
address = {Bonn}
}
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Mehr Information
ISBN: 978-3-88579-254-3
ISSN: 1617-5468
Datum: 2010
Sprache:
(en)
(en)
Typ: Text/Conference Paper

