Code Museums as Functional Tests for Static Analyses

dc.contributor.author	Speicher, Daniel
dc.contributor.author	Nonnen, Jan
dc.contributor.author	Bremm, Andri
dc.date.accessioned	2017-12-06T09:22:18Z
dc.date.available	2017-12-06T09:22:18Z
dc.date.issued	2012
dc.identifier.issn	0720-8928
dc.identifier.uri	http://dl.gi.de/handle/20.500.12116/8664
dc.description.abstract	Daniel Speicher, Jan Nonnen, Andri Bremm University of Bonn, Computer Science III, Bonn, Germany {dsp, nonnen, bremm}@cs.uni-bonn.de	en
dc.language.iso	en
dc.publisher	Köllen Druck & Verlag GmbH
dc.relation.ispartof	Softwaretechnik-Trends: Vol. 32, No. 2
dc.relation.ispartofseries	Softwaretechnik-Trends
dc.subject	Logic Program
dc.subject	Design Pattern
dc.subject	Functional Test
dc.subject	Program Element
dc.subject	Java Code
dc.title	Code Museums as Functional Tests for Static Analyses	en
dc.type	Text/Journal Article
mci.reference.pages	63-64
dc.identifier.doi	10.1007/BF03323482