| dc.contributor.author | Chen, Zhenyu | |
| dc.contributor.author | Hollmann, Axel | |
| dc.contributor.editor | Hegering, Heinz-Gerd | |
| dc.contributor.editor | Lehmann, Axel | |
| dc.contributor.editor | Ohlbach, Hans Jürgen | |
| dc.contributor.editor | Scheideler, Christian | |
| dc.date.accessioned | 2019-04-03T12:59:55Z | |
| dc.date.available | 2019-04-03T12:59:55Z | |
| dc.date.issued | 2008 | |
| dc.identifier.isbn | 978-3-88579-227-7 | |
| dc.identifier.issn | 1617-5468 | |
| dc.identifier.uri | http://dl.gi.de/handle/20.500.12116/21355 | |
| dc.description.abstract | Mutation-driven test case generation with model checking has been pro- posed to reduce the costs of specification-based mutation analysis. Most of the exist- ing work focuses on verifying the expected behavior in the original model, i.e. positive testing. In this paper negative testing is introduced to check the unexpected behavior. Mutants are divided into three types: increscent, decrescent, and cross mutants. Both, positive and negative testing is proposed to guarantee the detection of these mutants. A non-trivial example illustrates and validates our approach. | en |
| dc.language.iso | en | |
| dc.publisher | Gesellschaft für Informatik e. V. | |
| dc.relation.ispartof | INFORMATIK 2008. Beherrschbare Systeme – dank Informatik. Band 1 | |
| dc.relation.ispartofseries | Lecture Notes in Informatics (LNI) - Proceedings, Volume P-133 | |
| dc.title | Positive and Negative Testing with Mutation-Driven Model Checking | en |
| dc.type | Text/Conference Paper | |
| dc.pubPlace | Bonn | |
| mci.reference.pages | 187-192 | |
| mci.conference.sessiontitle | Regular Research Papers | |
| mci.conference.location | München | |
| mci.conference.date | 8. -13. September 2008 | |